Erratum: “Scanning impedance microscopy of electroactive interfaces” [Appl. Phys. Lett. 78, 1306 (2001)]
نویسندگان
چکیده
منابع مشابه
Erratum to "Lacunary statistical convergence of multiple sequences" [Appl. Math. Lett. 19(2006) 527-534]
(1) On page 529: The statement “we will denote the set of all double lacunary sequences by Nθr,s ” should be removed. (2) On page 529: In Definition 2.4, the statement “for every ε > 0” should be removed. (3) On page 530: In the proof of (C), for all K should be replaced with for all k and l. (4) The references “Li, J. Lacunary statistical convergence and inclusion properties between lacunary m...
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Impedance spectroscopy has long been recognized as one of the major techniques for the characterization of ac transport in materials. The primary limitation of this technique is the lack of spatial resolution that precludes the equivalent circuit elements from being unambiguously associated with individual microstructural features. Here we present a scanning probe microscopy technique for quant...
متن کاملComment on ‘ ‘ Quantum waveguide array generator for performing Fourier transforms : Alternate route to quantum computing ’ ’ † Appl . Phys . Lett . 79 , 2823 „ 2001
In their letter Akis and Ferry propose a quantum waveguide array approach for performing quantum Fourier transforms ~QFTs!. The waveguide produces 2 waves at its output with controllable relative phases; n is the number of binary splits of the input wave. The interference pattern from these waves is recorded and implements a Fourier transform. The authors claim that their waveguide approach is ...
متن کاملScanning impedance microscopy (SIM): A novel approach for AC transport imaging
Scanning Impedance Microscopy (SIM) is one of the novel scanning probe microscopy (SPM) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (C–V) behavior of the interface and AC transport properties. The SIM is an ordinary AFM equip...
متن کاملScanning impedance microscopy (SIM): A novel approach for AC transport imaging
Scanning Impedance Microscopy (SIM) is one of the novel scanning probe microscopy (SPM) techniques, which has been developed to taking image from sample surface, providing quantitative information with high lateral resolution on the interface capacitance, and investigating the local capacitance–voltage (C–V) behavior of the interface and AC transport properties. The SIM is an ordinary AFM equip...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2001
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.1379072